Product > X-Ray CT Inspection and Metrology
X-Ray CT Inspection and Metrology
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Powerful versatile X-Ray microfocus CT system for 3D metrology and analysis with up to 300kV / 500W
  • scatter|correct: highly improved CT quality level compared to conventional microfocus cone beam CT
  • Industry leading magnification and power at 300kV for high absorbing samples on a wide application range
  • Unique dual|tube configuration for high power μCT as well as high resolution nanoCT®
  • First compact 300 kV microfocus CT system with < 1 μm detail detectability
  • metrology|edition for precision measurements with up to 4+L/100 μm referring to VDI 2630 guideline
  • Max. sample size up to 500mm Ø x 600mm in height; 3D scanning area max. 290mm Ø x 400mm; up to 50kg
  • Light metal casting
  • Electronics assembly
  • Plastics molding
  • Turbine blade inspection
  • Internal defect analysis / 3D quanatitative porosity analysis
  • Assembly control
  • Materials structure analysis