Product > X-Ray CT Inspection and Metrology
X-Ray CT Inspection and Metrology
V|tome|x M
Powerful versatile X-Ray microfocus CT system for 3D metrology and analysis with up to 300kV / 500W
First industrial microCT system with high-flux|target and Scatter|correct technology
  • Scatter|correct: Highly improved CT quality level compared to conventional microfocus cone beam CT
  • High-flux|target: Maintain high image quality and scan much faster, or with improved accuracy
  • Dynamic 41|100 detector: Doubled CT resolution at same scanning time or doubled throughput at same quality level compared to state of the art 200 μm pitch DXR detectors
  • Unique dual|tube configuration for high power μCT as well as high resolution nanoCT®
  • Metrology|edition for precision measurements with up to 4+L/100 μm referring to VDI 2630 guideline
  • Optional Production|edition for fully automated high throughput CT inspection
  • Max. sample size up to 500 mm Ø x 600 mm in height; 3D scanning area max. 290 mm Ø x 400 mm; up to 50 kg
  • Light metal casting
  • Electronics assembly
  • Plastics molding
  • Turbine blade inspection
  • Internal defect analysis / 3D quanatitative porosity analysis
  • Assembly control
  • Materials structure analysis