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Product > X-Ray CT Inspection and Metrology
X-Ray CT Inspection and Metrology
planarCT
Easy 2D plane and 3D volume inspection of complex printed circuit boards
 
Features
  • 2D slice view provides significant better result quality compared to conventional X-ray inspection with overlaying features
  • Excellent image quality and high magnification for wide defect coverage
  • Slice and ROI CT volume evaluation in any direction with GE’s 3D|viewer
  • Available with phoenix microme|x and nanome|x systems
  • Upgrade option for already installed systems
 
 
Advantages
 
  • 2D X-ray inspection of any board or package slices without destructive cutting and overlaying structures
  • Easy to adjust 3D CT without any sample preparation of fixing in a rotation stage for 3D pore evaluation etc.
  • No additional software required: acquisition, reconstruction and 2D or 3D evaluation with GEs proprietary phoenix|x-ray software