Microme|x / Nanome|x Neo

Precision tools for inspecting semiconductors, PCBs and more

The Phoenix Microme|x Neo and Nanome|x Neo provide high-resolution 2D X-ray technology and 3D computed tomography( CT) scanning in one system, enabling non-destructive testing (NDT) of electronic components – such as semiconductors, PCBs, lithium-ion batteries -- in industrial, automotive, aviation and consumer electronics industries. With innovative engineering coupled with ultra-high positioning accuracy, phoenix microme|x neo and nanome|x neo are ideally suited for industrial X-ray electronics inspections in process and quality control, failure analysis and R&D.

Features

Automated inspection in micrometer range with easy to program CAD based μAXI
Active cooling for high dynamic, live imaging at 180 kV configurations
Brilliant live imaging and fast data acquisition for 3D CT / PlanarCT scanning
30 frames per second with Waygate Technologies’ highly dynamic DXR flat panel detector
Up to 2 times faster data acquisition at same high image quality level with diamond|window
Option provided for 3D CT scans within up to 10 seconds