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Industrial Metrology
EdgeMaster
 
Automatic cutting edge measurement also in production
With the EdgeMaster you measure edges regardless of type, size, material or surface finish of the tool. The measurement system delivers fully automatic measurements and stable results even with external vibration and external light. It provides user-friendly operation with high measurement speed. High vertical resolution enables chipping measurement in addition to traceable roughness measurements at the rake face of edges. An intelligent illumination technology enables optimized illumination of surfaces with short exposure times, leading to fast measurements.
 
Benefits
  • Measurement of radius and form

With the use of radius-fit you measure radius, clearance angle, wedge angle, rake/chipping angle, edge symmetry as well as negative and positive bevel lengths. Inserts with both waterfall and trumpet shapes are measured. A fit of elliptic shapes into the edge region describes the shape by two radial parameters. The edge can also be compared to user-defined basket arch files or arbitrary shape.

  • Chipping and chamfer measurement

High resolution enables the measurement of ISO conforming parameters along the edge, making edge defects measurable and visible. Measurable parameters of edge break include chamfer width, various angles, width of edge break, normal distances and other ISO 1375 conform parameters.

  • Form deviation with difference measurement

3D measurements are automatically compared to an imported 3D data set or reference geometry. Measurable parameters include minimum, maximum and mean deviation from the reference surface. Also, form deviations are clearly visible by advanced color visualization.

 
FOCUS-VARIATION TECHNOLOGY
Focus-Variation combines the small depth of focus of an optical system with vertical scanning to provide topographical and color information from the variation of focus. The main component of the system is a precision optic containing various lens systems that can be equipped with different objectives, allowing measurements with different resolution.