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Product > Industrial Metrology
Industrial Metrology
FUSION NEX
CMM that has accomplished internal evolution to further demonstrate its overwhelmingly high actual accuracy and active scanning technology
 
Features
  • Highest-in-class guaranteed accuracy Maximum Permissible Indication Error (MPEE) 1.6+3L/1000μm.
  • Greatly improved probing stability Maximum Permissible Probing Error (MPEP) 1.6μm
  • Active Scanning Probe
  • Incorporates stylus auto change function as a standard feature
  • Light weight with optimized Anti Vibration Drive mechanism and FRP cover
  • Rotary probe PH10T/M provided as an option