Product > X-Ray CT Inspection and Metrology
X-Ray CT Inspection and Metrology
V|tome|x S
Industrial High-Resolution CT & X-Ray System
The V|tome|x S is a versatile high-resolution system for 2D X-ray inspection and 3D computed tomography (micro ct and nano ct) and 3D metrology. To allow high flexibility, the V|tome|x S may be equipped with a 180 kV/15 W high-power nanofocus X-ray tube and a 240 kV/320 W microfocus tube. Due to this unique combination, the CT system is a very effective and reliable tool for a wide range of applications from extreme high-resolution scans of low absorbing materials as well as for 3D analysis of high absorbing objects.
  • Unique open nanofocus-microfocus dual tube combination possible (180 kV / 15 W high-power nanofocus X-ray tube and 240 kV / 320 W microfocus tube)
  • Up to 10 times increased filament lifetime, ensuring long-term stability and optimizing system efficiency by Long-life|filament (optionally)
  • Up to 2 times faster data acquisition at the same high image quality level by Diamond|window (optionally)
  • Fast CT acquisition and brilliant live images by high dynamic temperature-stabilized GE DXR digital detector with 30 fps (frames per second) (optionally)
Customer Benefits
  • 3D Metrology package for dimensional measuring with extremely high precision, reproducibility and user-friendliness
  • The new GE High-flux|target makes CT scanning more efficient due to up to 2 times faster microCT scans or doubled resolution
  • Automated generation of first article inspection reports in < 1 hour possible
  • Excellent software modules for extremely high CT quality and ease of use