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Product > X-Ray CT Inspection and Metrology
X-Ray CT Inspection and Metrology
nanotom m
The phoenix nanotom m is a 180kV / 20W X-Ray nanoCT® system for high-resolution analysis and 3D metrology.
 
Features
  • Unique temperature stabilized digital GE DXR detector (3,072 x 2,400 pixels) for a high dynamic range > 10,000 : 1 and up to 4 times faster data acquisition at the same high image quality level
  • Granite-based manipulator for high stability
  • Max. sample size 240mm Ø x 250mm in height
  • New open 180kV / 15W high-power nanofocus Xray tube with down to 200nm detail detectability, optimized for long-term stability
  • diamond|window for extremely high focal spot stability and up to 2 times faster data acquisition at the same high image quality level
  • Down to 300nm minimum voxel size
  • Optimized ease of use due to intelligent system design and advanced phoenix datos|x CT software
  • 3D metrology package with temperature stabilized cabinet and high accuracy direct measuring system

 

 
Applications
  • 3D Computed Tomography
  • Material Science
  • Micro-engineering
  • Electronics
  • Life Sciences
  • Geo Sciences and much more